{"id":191,"date":"2016-11-18T14:44:58","date_gmt":"2016-11-18T05:44:58","guid":{"rendered":"http:\/\/heaven-field.com\/wordpress\/?page_id=191"},"modified":"2018-02-23T18:00:02","modified_gmt":"2018-02-23T09:00:02","slug":"product02","status":"publish","type":"page","link":"https:\/\/yamashitadenso.co.jp\/english2\/product\/product02","title":{"rendered":"Surface defect inspection system"},"content":{"rendered":"<h3><img decoding=\"async\" src=\"\/english2\/wp-content\/themes\/yamashita\/images\/h_product02_01.png\" alt=\"Surface defect inspection system\" \/><\/h3>\r\n<!--contents \u25bc-->\r\n<div class=\"contents category\">\r\n<div class=\"fixHeight\"><!--box \u25bc-->\r\n<section class=\"box\">\r\n<h4>Surface defect inspection system (normal type)<\/h4>\r\n<p class=\"pic\"><img decoding=\"async\" src=\"\/english2\/wp-content\/themes\/yamashita\/images\/img_product02_01.jpg\" alt=\"\" \/><\/p>\r\n<p class=\"txt\">Surface condition of specular flat substrate Wafer for inspection, glass substrate, others \u03c6 100 ~ \u03c6 300 compatible<\/p>\r\n\r\n<\/section><!--box \u25b2-->\r\n<!--box \u25bc-->\r\n\r\n<section class=\"box\">\r\n<h4>High magnification surface defect inspection system (magnifying magic mirror)<\/h4>\r\n<p class=\"pic\"><img decoding=\"async\" src=\"\/english2\/wp-content\/themes\/yamashita\/images\/img_product02_02.jpg\" alt=\"\" \/><\/p>\r\n<p class=\"txt\">Supports up to 50 times magnification Slip line inspection Surface inspection of hard disk, optical polished parts<\/p>\r\n\r\n<\/section><!--box \u25b2-->\r\n<!--box \u25bc-->\r\n\r\n<section class=\"box\">\r\n<h4>IR Magic Mirror<\/h4>\r\n<p class=\"pic\"><img decoding=\"async\" src=\"\/english2\/wp-content\/themes\/yamashita\/images\/img_product_none.jpg\" alt=\"\" \/><\/p>\r\n<p class=\"txt\">In preparation&#8230;<\/p>\r\n\r\n<\/section><!--box \u25b2-->\r\n\r\n<\/div>\r\n<\/div>\r\n<!--contents \u25b2-->","protected":false},"excerpt":{"rendered":"Surface defect inspection system (normal type) Surface condition of specular flat substrate Wafer for inspecti [&hellip;]","protected":false},"author":4,"featured_media":0,"parent":112,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-product.php","meta":{"footnotes":""},"class_list":["post-191","page","type-page","status-publish","hentry"],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/yamashitadenso.co.jp\/english2\/wp-json\/wp\/v2\/pages\/191","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/yamashitadenso.co.jp\/english2\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/yamashitadenso.co.jp\/english2\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/yamashitadenso.co.jp\/english2\/wp-json\/wp\/v2\/users\/4"}],"replies":[{"embeddable":true,"href":"https:\/\/yamashitadenso.co.jp\/english2\/wp-json\/wp\/v2\/comments?post=191"}],"version-history":[{"count":11,"href":"https:\/\/yamashitadenso.co.jp\/english2\/wp-json\/wp\/v2\/pages\/191\/revisions"}],"predecessor-version":[{"id":984,"href":"https:\/\/yamashitadenso.co.jp\/english2\/wp-json\/wp\/v2\/pages\/191\/revisions\/984"}],"up":[{"embeddable":true,"href":"https:\/\/yamashitadenso.co.jp\/english2\/wp-json\/wp\/v2\/pages\/112"}],"wp:attachment":[{"href":"https:\/\/yamashitadenso.co.jp\/english2\/wp-json\/wp\/v2\/media?parent=191"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}